관리 메뉴

태평계측기

DPO70000/MSO700000 본문

신품장비/텍트로닉스

DPO70000/MSO700000

임연원 2010. 2. 25. 11:17

Digital Phosphor Oscilloscopes / Digital Serial Analyzers / Mixed Signal Oscilloscopes

DPO/DSA70000B 및 MSO70000 디지털 및 혼합 신호 오실로스코프 시리즈 

 

Features & Benefits

  • On All Four Channels Simultaneously
    • 20, 16, 12.5, 8, 6, and 4 GHz Bandwidth Models
    • Up to 50 GS/s Real-Time Sample Rate
    • Up to 250 Megasample Record Length with MultiView Zoom™ Feature for Quick Navigation
    • Fastest Waveform Capture Rate with >300,000 wfms/s maximum per channel
  • Highest Bandwidth – Up to 20 GHz enables measurement on the latest high-speed serial standards
  • Superior Signal Integrity and Excellent Signal-to-Noise Ratio – Observe the truest representation of your waveform
  • Pinpoint? Triggering – Minimize time spent trying to acquire problem signals for efficient troubleshooting and shortened debug time
  • 5 Gb/s Real-time Serial Trigger – Assures triggering on the first instance of a specified NRZ or 8b/10b pattern to allow isolation of pattern-dependent effects
  • Search & Mark – Provides waveform pattern matching and software triggers for signals of interest
  • 16 Logic Channels with 80 ps Timing Resolution for Debug of Digital and Analog Signals (MSO70000 only)
  • P7500 TriMode™ Probing System – Perfectly matched signal connectivity from 4 GHz to 20 GHz
  • Application Support for High-speed Serial Industry Standards, RF, Power Supplies and Memory – Enables standard-specific certification, measurement automation, and ease of use
  • P6780 and P6717 High Performance 17 Channel Logic Probes with Bandwidths up to 2.5 GHz for Connections to Today’s Fast Digital Signals (MSO70000 only)

Applications

  • Design Verification including Signal Integrity, Jitter, and Timing Analysis
  • Design Characterization for High-speed, Sophisticated Designs
  • Certification Testing of Serial Data Streams for Industry Standards
  • Memory Bus Analysis and Debug
  • Prototype Turn-on and Power Supply Verification
  • Research and Investigation of Transient Phenomena
  • Production Testing of Complex Systems
  • Spectral Analysis of Transient or Wide-bandwidth RF Signals

Tools for Your Complete Design Cycles


P7500 TriMode probes simplify complex measurement setups.


P6780 Differential Logic Probes provide high-bandwidth connections for up to 16 digital signals.

Tektronix understands that engineers rely on an oscilloscope throughout their design cycle, from prototype turn-on to production testing. The DPO/DSA70000B and MSO70000 Series oscilloscopes’ unique capabilities combined with exceptional signal acquisition performance and analysis accelerate your measurement tasks.

Unmatched Acquisition and Signal-to-Noise Performance

The superior signal integrity and excellent signal-to-noise ratio of the DPO/DSA70000B and MSO70000 Series ensures confidence in your measurement results.

  • High bandwidth, up to 20 GHz, matched across 4 channels
  • Bandwidth enhancement eliminates imperfections in frequency response all the way to the probe tip. The user-selectable filter for each channel provides magnitude and phase correction for more accurate representation of extremely fast signals. In addition, only Tektronix allows the user to disable the bandwidth enhancement for applications needing the highest measurement throughput
  • Simultaneous high sample rate on all channels captures more signal details (transients, imperfections, fast edges)
    • 50 GS/s on all analog channels for the 12.5, 16, and 20 GHz models
    • 25 GS/s on all analog channels for the 4, 6, and 8 GHz models
    • 12.5 GS/s on all logic channels in the MSO70000 Series
  • Lowest jitter noise floor and highest vertical accuracy provide additional margin in your measurements
  • Long record length provides high resolution and extended-duration waveform capture
    • Standard 10 MS per channel on the DPO70000B and MSO70000 Series and 20 MS on the DSA70000B Series
    • Optional up to 125 MS on all four channels for the 4, 6, and 8 GHz models
    • Optional up to 250 MS on all four channels for the 12.5, 16, and 20 GHz models
    • On the MSO70000 Series, the record length of logic channels match the analog record lengths for uncompromised analog and digital acquisition
    • MultiView Zoom helps you manage long records, compare and analyze multiple waveform segments
  • With high signal-to-noise ratio and low internal noise floor, the DPO/DSA70000B and MSO70000 Series enable you to perform precise characterization measurements. When debugging a DUT, a low noise floor and maximum signal fidelity of the measurement instrument allows you to find the smallest anomalies that might affect the DUT’s performance. For RF signals, a lower noise floor translates into a higher dynamic range, opening the DPO/DSA70000B and MSO70000 for a wider range of applications

Widest Range of Probing Solutions – Whether you need to measure 8 Gb/s serial data, fast digital logic, or switching currents from your new power supply design, Tektronix offers a vast array of probing solutions, including active single ended, differential, logic, high voltage, current, optical, and a wide range of probe and oscilloscope accessories.

Quick Selection Guide

Model

Analog Bandwidth

Analog Sample Rate 4 Channels

Standard Memory – Analog + Digital

Analog Channels

Logic Channels

DPO70404B

4 GHz

25 GS/s

10 MS

4

   

DSA70404B

4 GHz

25 GS/s

20 MS

4

   

MSO70404

4 GHz

25 GS/s

10 MS

4

16

DPO70604B

6 GHz

25 GS/s

10 MS

4

   

DSA70604B

6 GHz

25 GS/s

20 MS

4

   

MSO70604

6 GHz

25 GS/s

10 MS

4

16

DPO70804B

8 GHz

25 GS/s

10 MS

4

   

DSA70804B

8 GHz

25 GS/s

20 MS

4

   

MSO70804

8 GHz

25 GS/s

10 MS

4

16

DPO71254B

12.5 GHz

50 GS/s

10 MS

4

   

DSA71254B

12.5 GHz

50 GS/s

20 MS

4

   

MSO71254

12.5 GHz

50 GS/s

10 MS

4

16

DPO71604B

16 GHz

50 GS/s

10 MS

4

   

DSA71604B

16 GHz

50 GS/s

20 MS

4

   

MSO71604

16 GHz

50 GS/s

10 MS

4

16

DPO72004B

20 GHz

50 GS/s

10 MS

4

   

DSA72004B

20 GHz

50 GS/s

20 MS

4

   

MSO72004

20 GHz

50 GS/s

10 MS

4

16

System Turn-on and Verification

From the time a design is first powered up through the initial operational checks, the DPO/DSA70000B and MSO70000 Series provide the features you need.

Uncompromised Four Channel Acquisition

With the industry's lowest noise and up to 50 GS/s sample rate on all four channels the DPO70000B Series ensures that signal integrity checks and timing analysis can be done without worrying about noise and jitter in the scope distorting the measurements. Single shot bandwidths up to 20 GHz on all four channels ensure that you’ll capture your signals of interest without worrying about undersampling when using more than 1 or 2 channels.

16 Channel Digital Acquisition (MSO70000 only)

When you have many interfaces to verify, the MSO70000 Series with 4 analog and 16 logic channels enables efficient channel-to-channel timing checks. With timing resolution of 80 ps, the MSO70000’s digital acquisition system enables you to make precise timing measurements on as many as 20 channels simultaneously.

iCapture – one Connection for Analog and Digital (MSO70000 only)

The number of signals that must be verified can often make the checkout of a design long and involved. By using the iCapture digital-to-analog multiplexer feature, you can easily verify the analog characteristics of any of the 16 signals connected to the MSO70000 Series’ digital channels. Using iCapture, you can quickly view the analog characteristics of any input channel. If the signal is working as expected, relegate it to a digital-only view and continue testing other lines.

Bus Decoding and Triggering (MSO70000 only)

Symbolic Bus Formats Simplify Identifying System States and Setting up Bus Triggers.

Verifying your system operation often requires the ability to see specific system states on a key bus such as the DDR SDRAM interface. The MSO70000 includes parallel and low-speed serial bus decoding that provides deeper insight into the system’s behavior. Using the bus triggering capability of the MSO70000 to isolate the exact state needed or find invalid bus sequences is as easy as defining the bus and choosing the bit pattern or symbolic word that describes the desired state.

Deep Record Length Available on All Channels

Longer duration events such as power supply sequencing and system status words can be analyzed without sacrificing timing resolution using the long memory depths available on all four analog channels in the DPO/DSA70000B Series as well as the 16 logic channels of the MSO70000 Series. Optional memory depths up to 125 MS (Option 10XL) on the 4, 6, and 8 GHz models and 250 MS (Option 20XL) on the 12.5, 16, and 20 GHz models are available.


10 ms Duration Capture of Synchronous High-speed and Low-speed Signals at 25 GS/s.

Power supplies can be a critical failure point in any system. Careful testing of the power delivery system’s power on sequence can be time consuming. The MSO70000 provides independent logic thresholds for each logic channel enabling multiple logic voltages to be set up and observed simultaneously for quick verification of the system’s power rails.

Protocol and Serial Pattern Triggering

To verify serial architectures, the serial pattern triggering for NRZ serial data streams with built-in clock recovery in the DPO/DSA70000B and MSO70000 Series allows correlating events across physical and link layers. The instruments can recover the clock signal, identify transitions, and allow you to set the desired encoded words for the serial pattern trigger to capture. This feature comes standard on the DSA70000B Series and is available on DPO70000B and MSO70000 models as Option PTH. Option PTH and the DSA70000B Series cover serial standards up to 3.125 Gb/s. For higher bit rate standards like USB 3.0, Option PTU on the DPO70000B Series and Option STU on the DSA70000B Series extend 8b10b triggering and decode to 5 Gb/s.

Pattern Lock Triggering adds an extra dimension to NRZ serial pattern triggering by enabling the oscilloscope to take synchronized acquisitions of a long serial test pattern with outstanding time base accuracy. Pattern lock triggering can be used to remove random jitter from long serial data patterns. Effects of specific bit transitions can be investigated, and averaging can be used with mask testing. Pattern Lock Triggering supports up to 6.25 Gb/s NRZ serial data stream and is standard on the DSA70000B instruments, or is included as part of Option PTH on the DPO70000B and MSO70000 models.

System Characterization and Margin Testing

When a design is working correctly and the next task is to fully characterize its performance, the DSA70000B Series offers the industry’s most comprehensive set of analysis and certification tools, such as math expressions, waveform mask testing, pass/fail testing, event searching, and event marking. Tools for automation reduce the tedium and speed up the process of making hundreds of characterization measurements.

Advanced Waveform Analysis

Full analysis of the power, voltage, and temperature corners of your system under test can be very time consuming. The DPO/DSA70000B and MSO70000 Series offer a wide range of built-in advanced waveform analysis tools.

Waveform cursors make it easy to measure trace-to-trace timing characteristics, while cursors that link between YT and XY display modes make it easy to investigate phase relationships and Safe Operating Area violations. Select from 53 automatic measurements using a graphical palette that logically organizes measurements into Amplitude, Time, Histogram, and Communications categories. Gather further insight into your measurement results with statistical data such as mean, min, max, standard deviation, and population.

Define and apply math expressions to waveform data for on-screen results in terms that you can use. Access common waveform math functions with the touch of a button. Or, for advanced applications, create algebraic expressions consisting of live waveforms, reference waveforms, math functions, measurement values, scalars, and user-adjustable variables with an easy-to-use calculator-style editor.

With deep acquisition memory, margin testing can be done over many cycles and long duration trends in the data can be observed. Plus, data from the oscilloscope can be captured into Microsoft Excel using the unique Excel toolbar, and formatted into custom reports using the Word toolbar provided with the DPO/DSA70000B and MSO70000 products.

Automated Tools to Increase Measurement Throughput

DPOJET Jitter And Eye Diagram Analysis – Simplify identifying signal integrity concerns, jitter, and their related sources with DPOJET software. DPOJET provides the highest sensitivity and accuracy available for real-time oscilloscopes.

Ease of use and measurement throughput are key when a large number of measurements must be completed with a performance oscilloscope. The DSA70000B comes standard with the DPOJET Advanced Jitter and Eye Diagram measurement application, providing the tools you need to quickly perform a high volume of measurements and collect statistics. DPOJET is available on the DPO70000B and MSO70000 as Option DJA. Application specific measurement packages are also available that extend DPOJET and perform the extensive set of tests required by industry standard groups.

RF and Vector Signal Analysis

When vector signal analysis of RF or baseband signals are needed the optional SignalVu application enables measurements in multiple domains (frequency, time, phase, modulation) simultaneously. SignalVu measurements are fully correlated with the scope’s time domain acquisition and triggering. Time domain events, such as commands to a RF subsystem, can be used as trigger events, while the subsystem’s RF signal can be seen in the frequency domain.

TekExpress™ Software Automation Framework

TekExpress USB 3.0 Automated Test Software (Option USB-TX) – TekExpress USB 3.0 provides an automated, simple, and efficient way to test USB 3.0 Transmitter hosts and devices consistent with the requirements of the SuperSpeed Universal Serial Bus Electrical Compliance Test Specification. The application automates selection of appropriate CTLE and reference channel emulation filters and measurement selections based on device type, test type, test points, and selected probes. In addition, USB-TX leverages DPOJET allowing for debug and advanced characterization of USB 3.0 solutions.


TekExpress SATA Automated Compliance Test Software – Complete support for SATA Gen1 and SATA Gen2 defined test suites. Reduce your compliance test time by approximately 70% with simple, efficient automation of all required test suites with TekExpress software. Also included is auto-recognition of all required test equipment, precise DUT/Host control, and one-button testing.

The TekExpress software automation framework has been developed for automated one-button testing of high-speed serial data standards. Built on top of National Instruments TestStand product, TekExpress efficiently executes the required tests for many serial standards like SATA Rev 3.0, USB 3.0, DisplayPort and 10GBase-T Ethernet. Run on an external Windows PC, the TekExpress SATA software orchestrates the instrument setup and control sequences to provide complete test results for complete design validation.

Beyond using the TekExpress framework, custom applications that you develop yourself using application development environments such as MATLAB? can further extend the tool set of the DPO/DSA70000B and MSO70000 Series.

Characterization measurements depend upon accuracy and repeatability. The wide bandwidth and unmatched signal fidelity of the DPO/DSA70000B and MSO70000 analog front end ensures that your signal quality measurements such as rise times are faithful with capture of the signal's 5th harmonic and flatness of ±0.5 dB.

Custom Filter and De-Embed Capability

SDLA - Serial Data Link Analysis (options SLE and SLA) – Offers the capability to emulate the serial data channel, de-embed a fixture or other network, and add or remove transmitter equalization. Option SLA adds processing of waveforms with FFE and DFE equalizations and automatic equalizer training. DPOJET provides advanced measurement and jitter analysis of the resulting waveforms.

Create your own filters or use the filters provided as standard with the DPO/DSA70000B and MSO70000 Series to enhance your ability to isolate or remove a component of your signal (noise or specific harmonics of the signal). These customizable FIR filters can be used to implement signal-processing techniques, such as removing signal pre-emphasis or minimizing the effects of fixtures and cables connected to the device under test. Using the optional Serial Data Link Analysis (SDLA) application, you can gain further insight into serial data links with the capability to emulate the serial data channel from its S-parameters, de-embed the fixture or other network, and add or remove transmitter equalization (de-emphasis/pre-emphasis).

Certification

Before a product can go to market, you often need to complete a series of certification tests on the industry-standard high-speed serial buses in your design. These tests can involve many hours of wrestling with test fixtures, reading certification documents and collecting sufficient data to validate that your system passes the required tests.

Application Specific Solutions – Enable Standard Specific Certification, Measurement Automation, and Extended Signal Analysis

Accurate, Simple, and Customizable Physical Layer Certification Testing – For designers with industry-standard certification needs, standard-specific compliance and analysis modules that configure the pass/fail waveform mask and measurement limit testing are available as options to the DPO/DSA70000B and MSO70000. Modules are available for PCI Express, DDR Memory, Serial ATA and SAS, InfiniBand, HDMI, Ethernet, DisplayPort, DVI, UWB, MIPI? D-PHY, Power Supplies, and USB.

See the following list for highlights of the available application-specific solutions.


DDR Memory Bus Analysis (Option DDRA) – Automatically identify DDR1, LPDDR1, LPDDR2, DDR2, DDR3, and GDDR3 Reads and Writes and makes JEDEC conformance measurements with pass/fail results on all edges in every Read and Write burst. DDRA also provides capabilities for measurements of clock, address, and control signals. In addition to enabling conformance testing DDRA with DPOJET is the fastest way to debug complex memory signaling issues.


USB 3.0 Transmitter Test Solution (Option USB3) – Perform verification, characterization, and debug of USB 3.0 devices. Measurements are implemented in DPOJET and are compliant to the USB 3.0 specification. For compliance and automation, USB-TX is available, which also includes Option USB3.


PCI Express Analysis Test Solution (Option PCE) – Analyze the performance of your PCI-Express Rev 1.0, 2.0, or 3.0 (draft spec) design with comprehensive test support. Using DPOJET, Option PCE enables tests that conform to PCI-SIG standards.


Ethernet Compliance Test Solution (Option ET3) – Receive full PHY layer support for Ethernet variants 10Base-T, 100Base-TX, and 1000Base-T with Tektronix’ comprehensive, integrated Ethernet tool set. Analog verification, automated compliance software, and device characterization solutions are all included.


MIPI? D-PHY Transmitter Characterization and Compliance Test Solution – Verify to the D-PHY specification, rapidly characterize and discover sources of jitter and signal integrity concerns. Perform high-speed data-clock timing measurements, along with other electrical characteristics in high-speed or low-power modes.


DVI Compliance Test Solution (Option DVI) – Obtain quick and dependable results with the DVI compliance test software. Automated testing based on pass/fail detection dramatically enhances productivity.


XGbT 10GBase-T Automated Compliance Software – Quickly perform 10GBase-T measurements per the IEEE 802.3an-2006 standard including Power Spectral Density (PSD), Power Level, and Linearity, with a simplified instrument configuration. XGbT provides flexible control over test configurations and analysis parameters, enabling more in-depth device characterization.


HDMI Compliance Test Solution (Option HT3) – Fast, efficient solution for HDMI compliance measurement challenges, no matter if you are working on a Source, Cable, or Sink solution. This application provides all the HDMI compliance test solutions you need to ensure quality and interoperability.


DisplayPort Compliance Test Solution (Option DSPT) – Support DisplayPort Compliance Test Standard (CTS) source test with four-line simultaneous testing using the Tektronix P7300SMA Series probes and DisplayPort software. Detailed test reports with waveform plots, pass/fail results, and margin analysis are included.


Ultra Wideband Spectral Analysis Software (Option UWB) – Analyze hundreds of packet, TFC, and data-rate combinations. In addition, the automatic WiMedia modulation analysis configuration will analyze how complex wideband signals change frequency and amplitude with time using real-time spectrograms spanning 20 GHz.


Power Measurement and Analysis Software (Option PWR) – Improve the efficiency of switching power supplies with increased power densities. Measure and analyze power dissipation in power supply switching devices and magnetic components, and generate detailed test reports in customizable formats.


SignalVu™ Vector Signal Analysis – Easily verify wide-bandwidth designs such as wideband radar, high data rate satellite links, or frequency-hopping radios and characterize wideband spectral events. SignalVu combines the functionality of a vector signal analyzer, a spectrum analyzer, and the powerful triggering capabilities of the DPO/DSA70000B and MSO70000 – all in a single package.

DSA70000B – A Dedicated Solution Configured for Today’s High-speed Serial Design Challenges

The DSA70000B Digital Serial Analyzer is specially configured to address high-speed serial data designs by encapsulating many of the serial domain features needed for high-speed serial verification and characterization. These standard features on the DSA70000B Series are options on the DPO70000B and MSO70000 Series.

Serial Pattern Triggering - Real-time serial pattern triggering and protocol decode with built-in clock recovery recovers the clock signal, identifies the transitions, and decodes characters and other protocol data. You can see the 8b/10b bit sequences decoded into their words for convenient analysis, or you can set the desired encoded words for the serial pattern trigger to capture. With Pattern Lock Triggering, the DSA70000B can synchronize to long serial test patterns up to 6.25 Gb/s and remove random jitter. The DSA70000B Series covers serial standards up to 3.125 Gb/s with an option to support up to 5 Gb/s (Option STU).

DPOJET Jitter, Timing, and Eye-diagram Analysis - The DSA70000B Series features the highest-accuracy jitter and timing measurements as well as comprehensive analysis algorithms. Tight timing margins demand stable, low-jitter designs. You can make jitter measurements over contiguous clock cycles on every valid pulse in a single-shot acquisition. Multiple measurements and trend plots quickly show system timing under variable conditions, including Random and Deterministic Jitter separation.


Communications Mask Testing

Communications Mask Testing - Provides a complete portfolio of masks for verifying compliance to serial communications standards. 156 masks for the following standards are supported – PCI Express, ITU-T/ANSI T1.102, Ethernet IEEE 802.3, ANSI X3.263, Sonet/SDH, Fibre Channel, InfiniBand, USB, Serial ATA, Serial Attached SCSI, IEEE 1394b, RapidIO, OIF Standards.

20 MS Record Length - 20 MS on all four channels provides a longer time sequence at high resolution. Optional record lengths up to 125 MS for the 4, 6, and 8 GHz models, 250 MS for the 12.5, 16 and 20 GHz models extend the acquisition time sequence.

Advanced Event Search and Mark - Finding important events such as fast or slow transitions, setup and hold violations, or logic patterns within a long-duration capture is made easy with the pattern matching and software triggering functionality of Event Search and Mark.

With standard features that extend the functionality of the Tektronix DPO70000B Series to address high-speed serial signal analysis and certification, the DSA70000B Series offers a specialized instrument that efficiently addresses your design challenges.

DSA Feature Set in the MSO70000

If you need to combine the functionality of the DSA70000B and the MSO70000, the DSA options for the MSO70000 provide the DSA’s high-speed serial test features in an MSO (see Option DSAH or DSAU in the Ordering Information section below).

User-selectable Bandwidth Limit Filters

While wide bandwidth is needed to characterize your high-speed serial designs, certification testing can require a specific instrument bandwidth appropriate for the signal’s data rate in order to correlate test results between different test labs. The DPO/DSA70000B and MSO70000 Series feature user-selectable bandwidth limiting filters. Using these bandwidth limit filters which range from 500 MHz to 19 GHz, you will ensure that your measurement is done using the bandwidth specified by the industry standard.

Debugging

Throughout the design cycle, DPO/DSA70000B and MSO70000 Series oscilloscopes provide the ability to debug malfunctioning subsystems and isolate the cause. Using FastAcq’s high waveform capture rate, you can quickly identify signal anomalies that occur intermittently – saving minutes, hours, or even days by quickly revealing the nature of faults so sophisticated trigger modes can be applied to isolate them. Using Pinpoint triggers, infrequent events such as glitches or signal runts caused by bus contention or signal integrity issues can be captured, analyzed and then eliminated.

FastAcq – Expedites Debugging by Clearly Showing Imperfections

More than just color-grading or event scanning, FastAcq’s proprietary DPX? acquisition technology captures signals at more than 300,000 waveforms per second on all four channels simultaneously, dramatically increasing the probability of discovering infrequent fault events. And with a simple turn of the intensity knob you can clearly “see a world others don’t see”, displaying the complete picture of your circuit’s operation. Some oscilloscope vendors claim high waveform capture rates for short bursts of time, but only DPO/DSA70000B and MSO70000 oscilloscopes, enabled by DPX technology, can deliver these fast waveform capture rates on a sustained basis.

Pinpoint? Trigger

Whether you’re trying to find a problem signal or need to isolate a section of a complex signal for further analysis, like a DDR read or write burst, Tektronix’ Pinpoint triggering provides the solution. The Pinpoint trigger system uses Silicon Germanium (SiGe) technology to provide very high trigger sensitivity with very low trigger jitter and the ability to capture very narrow glitches. Pinpoint triggering allows selection of virtually all trigger types on both A and B trigger events delivering the full suite of advanced trigger types for finding sequential trigger events. Pinpoint triggers provide trigger reset capabilities that begin the trigger sequence again after a specified time, state, or transition so that even events in the most complex signals can be captured. Other oscilloscopes typically offer less than 20 trigger combinations; Pinpoint triggering offers over 1400 combinations, all at full performance.

With Enhanced Triggering, trigger jitter is reduced to <100 fs. With this stability at the trigger point, the trigger point can be used as a measurement reference.

Logic Pattern Triggering

Logic pattern triggering allows logic qualification that controls when to look for the faults and ignore events that do not occur during the desired state. on the MSO70000 Series, up to 20 bit wide logic pattern triggering enhances the Pinpoint trigger capabilities by helping you isolate the specific system state and analog events that are causing system failure.

Integrated Logic Channels (MSO70000 only)

Integrated Logic Channels – Provide time-correlated analog and digital visibility for system debugging.

The MSO70000 extends the debug capabilities of a 4-channel oscilloscope with an additional 16 logic channels that can be used to provide system level context when the fault occurs. This context, such as an illegal system state or error, may be the clue that leads to the root cause. When other oscilloscopes require you to use a logic analyzer to see the digital data you need to solve your debugging challenge, the MSO70000 can effectively debug and verify many digital timing issues in the system more quickly and easily. With 80 ps timing resolution and channel-to-channel skews of as little as 160 ps, the integrated logic channels allow you to view and measure time-correlated digital and analog data in the same display window.

iCapture (MSO70000 only)

When an anomaly is seen on digital lines, iCapture delivers new insight into the analog behavior of the digital signals. With iCapture, you can route any 4 of the 16 logic channels to the MSO70000’s analog acquisition system so that these signals can be viewed in finer detail. iCapture’s unique multiplexer circuitry provides simultaneous digital and analog views of signals without having to move the logic probe or double probe the circuit.

FastFrame

When the key events you are interested in are widely spaced in time, such as bursts of activity on a bus, FastFrame segmented memory feature on the DPO/DSA70000B and MSO70000 Series enables you to capture the events of interest while conserving acquisition memory. Using multiple trigger events, FastFrame captures and stores short bursts of signals and saves them as frames for later viewing and analysis. on the MSO70000, FastFrame and bus or logic triggering enable you to capture your fastest, bursty signals on the analog channels at the highest sample rate while the logic channel trigger recognizes the bus cycle of interest. Capturing thousands frames is possible, so long term trends and changes in the bursting signal can be analyzed.

Advanced Search and Mark

Advanced Search and Mark – Highlights important events, skips unimportant ones, and navigates between events of interest effortlessly.

Isolating the key event causing your system failure can often be a tedious task. With the Advanced Event Search and Mark (Option ASM) feature examining data and highlighting important events, skipping the unimportant ones, and enhancing the comprehension of event relationships is made easy. With ASM, you’ll be able to navigate between the events of interest effortlessly and uncover that rare event you have been trying to find.

Embedded Serial Bus (I2C, SPI) Decoding and Triggering (MSO70000 only)

The MSO70000 Series instruments provide I2C and SPI serial bus decoding and bus triggering that enable you to monitor or debug subsystems and components, such as frequency synthesizers, D/A converters, and Flash Memory that are controlled or monitored using I2C or SPI serial buses. While monitoring or debugging these serial buses alone is relatively easy, decoding events on the serial bus can also enable more complex system level debugging. When you experience an issue with a higher-speed serial interface, the clue to what is going wrong may be found by using the MSO70000 Series bus decode feature to observe the data on your I2C or SPI interface.

Probing – Analog And Digital

Often the biggest challenge in debugging a system is getting access to the required signals. Tektronix offers a wide array of probing solutions, including the P7500 TriMode probing system with bandwidths that are perfectly matched to the DPO/DSA70000B and MSO70000 Series. The P7500 TriMode probes allow you to switch among differential, single-ended, and common-mode measurements without moving the probe from its connection points. The P7500 Series offers probes with performance from 4 GHz to 20 GHz and offers several low-cost solder tips with quick connection features that allow moving the probe to various solder points fast and easy.

On the MSO70000, the P6780 and P6717 logic probes provide connectivity to low-speed and high-speed digital signals with low loading, small size and a range of accessories for soldering and browsing.


The low-cost solder tips available for the P7500 TriMode probes allow quick connection so moving the probe to various solder points is fast and easy.


Solder tip accessories designed for the P6780 differential logic probes provide access to signals on tightly spaced vias and fine-pitched components.

Production Testing

In addition to assisting engineers with design tasks, the DPO/DSA70000B and MSO70000 can provide test engineers with the ability to test analog and digital signals with a wide range of clock speeds and data rates. Rackmount options are available for mounting the DPO/DSA70000B and MSO70000 into an EIA standard 19 inch (487 mm) rack. An IEEE 488.2 standard GPIB interface is standard on all models.

OpenChoice? Analysis Tools

The OpenChoice Software allows you to customize your test and measurement system with familiar analysis tools. The analysis and networking features of the OpenChoice software add more flexibility to Tektronix’ DPO/DSA70000B and MSO70000 Series oscilloscopes: Using the fast embedded bus, waveform data can be moved directly from acquisition to analysis applications on the Windows desktop at much faster speeds than conventional GPIB transfers.

Tektronix’ implementation of industry-standard protocols, such as TekVISA™ interface and ActiveX controls, are included for using and enhancing Windows applications for data analysis and documentation. IVI instrument drivers are included to enable easy communication with the oscilloscope using GPIB, RS-232, and LAN connections from programs running on the instrument or an external PC. Or, use the Software Developer’s Kit (SDK) to help create custom software to automate multistep processes in waveform collection and analysis with Visual BASIC, C, C++, MATLAB, LabVIEW, LabWindows/CVI, and other common Application Development Environments. Integration of the oscilloscope with external PCs and non-Windows hosts is also supported.

Research

With industry leading acquisition speed and signal-to-noise ratio performance, the DPO/DSA70000B and MSO70000 can provide researchers with tools that allow them to capture, display, and analyze high-speed and transient signals with unmatched precision.

Full Control of Acquisition and Display Parameters

You have full control of the instrument’s acquisition modes. Choose the mode you need to do your job the fastest: Automatic, Constant Sample Rate, or Manual settings. When you are doing signal exploration and want a lively signal, the default Automatic mode provides you with the liveliest display update rate. If you want the highest real-time sample rate that will give you the most measurement accuracy, then the Constant Sample Rate mode is for you. It will maintain the highest sample rate and provide the best real-time resolution. Finally the Manual mode ensures direct and independent control of the sample rate and record length for applications requiring specific settings.

TekLink™

When you need to capture a large number of signals simultaneously, TekLink allows you to synchronize multiple DPO/DSA70000B and MSO70000 oscilloscopes and acquire more than four channels. TekLink enables synchronized capture on up to 4 oscilloscopes with one trigger event.

Document Tools

The OpenChoice architecture provides a comprehensive software infrastructure for faster, more versatile operations. Data transfer utilities, such as the Excel or Word toolbar plug-ins can be used to simplify analysis and documentation on the Windows desktop or on an external PC.

Unmatched Usability

The DPO/DSA70000B Series instruments excel in usability with a suite of productivity features, such as a touch screen, flat menu structures, intuitive graphical icons, knob-per-channel vertical controls, right clicks, mouse wheel operation, and familiar Windows-based controls.

MyScope? – Create Your Own Control Windows

Easily create your own personalized "toolbox" of oscilloscope features in a matter of minutes using a simple, visual, drag-and-drop process. once created, these custom control windows are easily accessed through a dedicated MyScope button and menu selection on the oscilloscope button/menu bar, just like any other control window. You can make an unlimited number of custom control windows, enabling each person who uses the oscilloscope in a shared environment to have their own unique control window. MyScope control windows will benefit all oscilloscope users, eliminating the ramp-up time that many face when returning to the lab after not using an oscilloscope for a while, and enables the power user to be far more efficient. Everything you need is found in one control window rather than navigating through multiple menus to repeat similar tasks.

'신품장비 > 텍트로닉스' 카테고리의 다른 글

TDS-2000C 시리즈 가격표  (0) 2014.08.28
Passive Voltage Probes   (0) 2010.03.29
DSA8200  (0) 2010.02.25
MSO2000 Series • DPO2000 Series  (0) 2010.02.25
TDS3000C Series  (0) 2010.02.25